TY  - CPAPER
U1  - Konferenzveröffentlichung
A1  - Taudt, Christopher
A1  - Leyens, Christoph
A1  - Hartmann, Peter
A1  - Molotnikov, Andrey
ED  - Helvajian, Henry
ED  - Gu, Bo
ED  - Chen, Hongqiang
T1  - Darkfield-scattering surface analysis in powder-based AM-processes: analysis of a multiwavelength approach
T2  - Laser 3D Manufacturing XII
T3  - Proceedings of SPIE - 13354 
Y1  - 2025
U6  - https://doi.org/10.1117/12.3043198
DO  - https://doi.org/10.1117/12.3043198
AR  - 1335403
S2  - 1335403
PB  - SPIE
CY  - Bellingham, WA
ER  -